Spectroscopic Reflectometer is a fundamental instrument used for thin film thickness analysis for industry & research. This range is having CCD linear array image sensor for simultaneous measurement of reflectance at each wavelength. Spectroscopic Reflectometer is able to analyze thin films thickness, complex refractive index & surface roughness with high speed & repeatability. Advanced mathematical fitting algorithm, FFT based thickness measurement, analyze single or multi-layer films & fiber optic probe for reflectance measurement at normal incident angle is the highlights or can say features of this product.
Developed and Managed by Infocom Network Private Limited.