Spectroscopic Reflectometer is a fundamental instrument used for thin film thickness analysis for industry & research. This range is having CCD linear array image sensor for simultaneous measurement of reflectance at each wavelength. Spectroscopic Reflectometer is able to analyze thin films thickness, complex refractive index & surface roughness with high speed & repeatability. Advanced mathematical fitting algorithm, FFT based thickness measurement, analyze single or multi-layer films & fiber optic probe for reflectance measurement at normal incident angle is the highlights or can say features of this product.

SPECIFICATIONS

• Film Thickness range : 25 nm 1 m
• Reflectance Wavelength range : 400 nm 900 nm
• Transmittance / Absorbance range : 0 100%
• Light source : Tungsten Halogen Quartz Lamp, 50W
• Detector : CCD linear array, 3648 pixels
• Spectrometer : Spectra CDS 215
• Spectrometer wavelength range : VIS NIR
• Precision typically for SiO2 on NSF 66 : 5 nm
• Accuracy for same sample : 10 nm
• Optical Power : 20 W
• Light spot size : 1 mm
• Spot size on sample : 5 mm
• Optical fiber : Multimode Bi-furcated fiber with SMA fiber coupler
• Reference Sample : Enhanced silver with Yttrium & Bare Aluminum
• Standard Sample : SiO2 thin film on NSF 66 Substrate
• Measuring modes : Curve fitting / Regression Algorithms,
• FFT, FFT + Curve Fit
• Dispersion formulas : Cauchys, Sellmeiers, FFT & Empirical Models
• EMA models : Linear EMA, Bruggemann,
• Maxwell Garnett, Lorentz Lorenz models
• Material Library : Extendable Material user library
• PC Interface : RS232 / USB