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Spectroscopic Reflectometer

Spectroscopic Reflectometer

Product Details:

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Product Description

Spectroscopic Reflectometer is a fundamental instrument used for thin film thickness analysis for industry & research. This range is having CCD linear array image sensor for simultaneous measurement of reflectance at each wavelength. Spectroscopic Reflectometer is able to analyze thin films thickness, complex refractive index & surface roughness with high speed & repeatability. Advanced mathematical fitting algorithm, FFT based thickness measurement, analyze single or multi-layer films & fiber optic probe for reflectance measurement at normal incident angle is the highlights or can say features of this product.

SPECIFICATIONS

  • Film Thickness range : 25 nm – 1 μm
  • Reflectance Wavelength range : 400 nm – 900 nm
  • Transmittance / Absorbance range : 0 – 100%
  • Light source : Tungsten Halogen Quartz Lamp, 50W
  • Detector : CCD linear array, 3648 pixels
  • Spectrometer : Spectra CDS 215
  • Spectrometer wavelength range : VIS – NIR
  • Precision typically for SiO2 on NSF – 66 : ± 5 nm
  • Accuracy for same sample : ± 10 nm
  • Optical Power : 20 W
  • Light spot size : 1 mm
  • Spot size on sample : 5 mm
  • Optical fiber : Multimode Bi-furcated fiber with SMA fiber coupler
  • Reference Sample : Enhanced silver with Yttrium & Bare Aluminum
  • Standard Sample : SiO2 thin film on NSF – 66 Substrate
  • Measuring modes : Curve fitting / Regression Algorithms,
  • FFT, FFT + Curve Fit
  • Dispersion formulas : Cauchy’s, Sellmeiers, FFT & Empirical Models
  • EMA models : Linear EMA, Bruggemann,
  • Maxwell Garnett, Lorentz – Lorenz models
  • Material Library : Extendable Material user library
  • PC Interface : RS232 / USB

PARISA TECHNOLOGY

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