Near Normal Spectroscopic Reflectometer
Near Normal Spectroscopic Reflectometer is a fundamental instrument used for thin film thickness analysis for industry research. Holmarc’s NNSR (Model No: HO-NNSR-01) is able to analyze thin film’s thickness, complex refractive index surface roughness with high speed repeatability. NNSR theory works with complex matrix form of Fresnel equations. Absolute reflectance spectroscopy is the principle behind Reflectometer; which is the ratio of the intensity of the reflected light beam (usually polychromatic) to the intensity of the incident beam. Light beam which normally incident on the sample surface in turn reflect from top bottom of the thin film which get interfered is directed through optical fiber (Bi-furicated fibre) to CCD attached spectrometer via computer. On the monitor we get spectrogram with interference oscillations directly proportional to thin film thickness.